发明名称 High breakdown voltage semiconductor device with an insulated gate formed in a trench, and manufacturing process thereof
摘要 A semiconductor device, including: a semiconductor body (2); a trench (22) having side walls (22a, 22b) and a bottom; a gate region (14) made of conductive material, extending within the trench; an insulating region (60), extending along bottom portions of the side walls of the trench and on the bottom of the trench; a gate insulating layer (52), extending along top portions of the side walls of the trench, laterally with respect to the gate region; a conductive region (24), extending within the trench, surrounded at the top and laterally by the gate region and surrounded at the bottom and laterally by the insulating region; and a field insulating layer (54), arranged between the gate region and the conductive region. The gate insulating layer is connected to the insulating region by means of gate-connecting thickened portions (70a, 70b), each of which has a thickness that increases as the depth increases. The conductive region has corresponding side walls (24a, 24b), which are undulated, in such a way that the width of the conductive region varies in a non-monotonic way with the depth.
申请公布号 EP2701202(A2) 申请公布日期 2014.02.26
申请号 EP20130193878 申请日期 2012.06.29
申请人 STMICROELECTRONICS S.R.L. 发明人 BARLETTA, GIACOMO
分类号 H01L29/78;H01L21/336;H01L29/40 主分类号 H01L29/78
代理机构 代理人
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