发明名称 Surface Profile Measurement Probe
摘要 <p>A surface profile measurement probe comprising two spaced apart points 20 for contacting a convex surface to be measured and a straight edge or surface 22 moveable relative to the two points to enable the straight edge to be brought into contact with a convex surface contacted by the two points. A tip 10 protrudes from and is moveably mounted relative to the straight edge or surface for measuring the profile of a surface contacted by the straight edge.</p>
申请公布号 GB2505193(A) 申请公布日期 2014.02.26
申请号 GB20120014866 申请日期 2012.08.21
申请人 ELCOMETER LIMITED 发明人 COLIN JOHN MORLEY;JOHN MICHAEL WHITAKER;MICHAEL CARRINGTON SELLARS
分类号 G01B5/20;G01B7/28 主分类号 G01B5/20
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