发明名称 |
Semiconductor device, semiconductor system having the same and operating method thereof |
摘要 |
A semiconductor device includes a data storage unit configured to receive input data, outputs the input data with a difference in voltage level between logic levels, and output comparison data whose logic level is distinguished from the input data; a test operation unit configured to determine a logic level of test data periodically in response to a data reference voltage whose voltage level is determined in response to a level test code during a test operation period defined by a test entry command and a test exit command, and generate a test result signal by comparing a logic level of the comparison data with the logic level of the test data; and a test operation sensing signal generation unit configured to generate a test operation sensing signal that is activated in response to the test entry command and inactivated in response to the test result signal. |
申请公布号 |
US8659962(B2) |
申请公布日期 |
2014.02.25 |
申请号 |
US201213404446 |
申请日期 |
2012.02.24 |
申请人 |
LEE JEONG-HUN;HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE JEONG-HUN |
分类号 |
G11C7/00;G11C7/06;G11C7/10;G11C8/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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