发明名称 Metal tip for scanning probe applications and method of producing the same
摘要 A metal tip (1) for scanning probe applications is provided. The tip (1) has an axial extension (I), a radial extension (d), a pointy section (B) that extends axially from a section of maximum radial extension (5) to an atomically sharp end (9), and a blunt section (A) that extends axially from the section of maximum radial extension (5) to a blunt end (7), where the axial extension of the pointy section (B) is larger than the axial extension of the blunt section (A) The metal tip (1) has a mass of 10 mug or less.
申请公布号 US8661561(B2) 申请公布日期 2014.02.25
申请号 US201013389295 申请日期 2010.08.02
申请人 LAEGSGAARD ERIK;SPECS SURFACE NANO ANALYSIS GMBH 发明人 LAEGSGAARD ERIK
分类号 G01Q70/10 主分类号 G01Q70/10
代理机构 代理人
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