发明名称 ESD PROTECTION ELEMENT STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide an ESD protection element structure capable of having the same element structure as an internal circuit and is excellent in circuit protection capability.SOLUTION: An ESD protection element structure 1 includes: a well region 11 formed on a semiconductor substrate 50; a source region 12, a drain region 13, and a back-gate region 14 formed in the well region 11; a gate region 16 provided between the source region 12 and the drain region 13 via an insulating film 15; a first electrode 17 connecting the source region 12, the gate region 16, and the back-gate region 14 to one another and connecting them to a high-potential side; and a second electrode 18 connecting the drain region 13 to a low-potential side.
申请公布号 JP2014036186(A) 申请公布日期 2014.02.24
申请号 JP20120177931 申请日期 2012.08.10
申请人 TOKAI RIKA CO LTD 发明人 ADACHI KAZUYA
分类号 H01L27/06;H01L21/822;H01L21/8238;H01L27/04;H01L27/092 主分类号 H01L27/06
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