| 摘要 |
PROBLEM TO BE SOLVED: To provide a flaw detection method using a spark tester, which is capable of detecting only flaws affecting performance of a product without selectively detecting minute flaws not affecting functions of the product, to improve yield of the product.SOLUTION: In the flaw detection method using a spark tester, an electric wire 4 with an insulating film 3 is run in a lengthwise direction, and an electrode brush 5 is brought into contact with the running electric wire 4 while being applied with a voltage, and flaws of the insulating film 3 are detected by the reduction in insulation resistance of the electrode brush 5. The detection time for which it should be detected whether the insulation resistance is reduced or not is adjusted by detection time adjustment means 11 not to detect flaws smaller than a prescribed size but to detect only flaws of the prescribed size or larger, and the detection time adjustment means 11 uses an input filter value adjustment function specific to a sequencer 8. |
