| 摘要 |
PROBLEM TO BE SOLVED: To achieve a resolution equivalent to that in the case of capturing reflected light of slit light at one view point and to allow accurate measurement of a three-dimensional shape of an object, in a three-dimensional shape measurement device which uses a light-section method to capture reflected light of slit light at two view points.SOLUTION: A three-dimensional shape measurement device includes a cylindrical lens 23 for condensing slit light to irradiate an object K, two optical parts 24 and 25 arranged on both sides of a lengthwise-direction axis of the slit light to receive and guide reflected light of the radiated slit light, and a half mirror 26 arranged in such a position as to equalize optical path lengths of two reflected light beams guided from the object K via two optical parts 24 and 25, to accurately superpose the two reflected light beams and images the superposed reflected light beams by a camera part 28 to capture an image. |
