发明名称 ETCH WITH MIXED MODE PULSING
摘要 A method for etching a dielectric layer disposed below a patterned organic mask with features, with hardmasks at bottoms of some of the organic mask features is provided. An etch gas is provided. The etch gas is formed into a plasma. A bias RF with a frequency between 2 and 60 MHz is provided that provides pulsed bias with a pulse frequency between 10 Hz and 1 kHz wherein the pulsed bias selectively deposits on top of the organic mask with respect to the dielectric layer.
申请公布号 US2014051256(A1) 申请公布日期 2014.02.20
申请号 US201213586793 申请日期 2012.08.15
申请人 ZHONG QINGHUA;LI SIYI;KIRAKOSIAN ARMEN;ZHOU YIFENG;VINNAKOTA RAMKUMAR;KUO MING-SHU;RAGHAVAN SRIKANTH;KIMURA YOSHIE;KIM TAE WON;KAMARTHY GOWRI;LAM RESEARCH CORPORATION 发明人 ZHONG QINGHUA;LI SIYI;KIRAKOSIAN ARMEN;ZHOU YIFENG;VINNAKOTA RAMKUMAR;KUO MING-SHU;RAGHAVAN SRIKANTH;KIMURA YOSHIE;KIM TAE WON;KAMARTHY GOWRI
分类号 H01L21/3065 主分类号 H01L21/3065
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