发明名称 LATERAL DIFFUSION METAL OXIDE SEMICONDUCTOR TRANSISTOR STRUCTURE
摘要 A lateral diffusion metal-oxide-semiconductor (LDMOS) transistor structure comprises a barrier layer, a semiconductor layer, a source, a first drain and a guard ring. The barrier layer with a first polarity is disposed in a substrate. The semiconductor layer with a second polarity is disposed on the barrier layer. The source has a first polarity region and a second polarity region both formed in the semiconductor layer. The first drain is disposed in the semiconductor layer and has a drift region with the second polarity. The guard ring with the first polarity extends downward from a surface of the semiconductor layer in a manner of getting in touch with the barrier layer and to surround the source and the drain, and is electrically connected to the source.
申请公布号 US2014048877(A1) 申请公布日期 2014.02.20
申请号 US201213585801 申请日期 2012.08.14
申请人 LIAO WEI-SHAN;LIN AN-HUNG;LIN HONG-ZE;HUANG BO-JUI 发明人 LIAO WEI-SHAN;LIN AN-HUNG;LIN HONG-ZE;HUANG BO-JUI
分类号 H01L29/78 主分类号 H01L29/78
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