发明名称 IMMUNITY ANALYSIS METHOD AND IMMUNITY ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a high-sensitivity immunity analysis method and an analysis device.SOLUTION: There are provided an immunity analysis method and an analysis device which are configured to subject a component to be measured and an acquisition component singularly reacting therewith to reaction so that when the component to be measured is further present, a reactant is marked, to arrange the marked reactant at a spatially separated predetermined position, and to analyze the component to be measured with sensitivity and resolution of one molecule by detecting the mark of the marked reactant.
申请公布号 JP2014032101(A) 申请公布日期 2014.02.20
申请号 JP20120172483 申请日期 2012.08.03
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 IMAI KYOKO;SAITO TOSHIRO;IMAI KAZUNARI
分类号 G01N33/543;G01N21/64;G01N33/552;G01N33/553;G01N37/00 主分类号 G01N33/543
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