发明名称 |
TESTING OF DIGITAL TO ANALOG CONVERTERS IN SERIAL INTERFACES |
摘要 |
A system and method for testing digital to analog converters (DAC) in a serial interface having a comparator to receive an input signal and a local offset signal is disclosed. A first DAC selectably provides one of a global offset to the input signal during a normal mode of operation and a first test signal to the comparator during a test mode of operation. A second DAC selectably provides one of the local offset signals to the comparator during the normal mode of operation and a second test signal to the comparator during the test mode of operation. A test module may cause the first DAC to determine a first test signal to provide to the local offset input of the comparator and may cause the second DAC to incrementally change a test signal provided to the comparator. |
申请公布号 |
US2014049415(A1) |
申请公布日期 |
2014.02.20 |
申请号 |
US201213586176 |
申请日期 |
2012.08.15 |
申请人 |
BAUMGARTNER STEVEN J.;CORTI WILLIAM D.;NATONIO JOSEPH;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BAUMGARTNER STEVEN J.;CORTI WILLIAM D.;NATONIO JOSEPH |
分类号 |
H03M1/10 |
主分类号 |
H03M1/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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