| 摘要 |
<p>A vertical double-face CCD line scanning mechanism for a test zone, characterized by comprising a long-strip scanning window (19), an AB-face intermediate partition (20), an A-face CCD line scanning device and a B-face CCD line scanning device. The A-face CCD line scanning device and the B-face CCD line scanning device are arranged at both sides of the AB-face intermediate partition (20), respectively, and the AB-face intermediate partition (20) is provided thereon with the long-strip scanning window (19). This vertical double-face CCD line scanning mechanism for a test zone adopts simultaneous scanning on both faces, so a flipping action need not be performed on a product, the complexity of the mechanical structure is reduced, and because a flipping action is not needed, the decrease in efficiency generated due to flipping is saved. Thus, the efficiency of double-face scanning is higher, and the benefit is that production can be doubled. At the same time, since a flipping mechanism is omitted in the whole equipment, the volume of the equipment is greatly reduced, and more equipment can be placed in the same space, improving the utilization rate of a factory building effectively.</p> |
