发明名称 |
METHOD OF PERFORMING EDX IN A CHARGED–PARTICLE MICROSCOPE |
摘要 |
<p>In order to overcome disadvantages in EDX (Energy Dispersive X-ray) methodologies, a method and a charged particle microscope for performing the method involve using the results of a relatively fast pre-scan to pre-set an optimal value of a chosen input beam parameter, such as beam current, before beginning the acquisition of a matrix of x-ray spectra for a sample.</p> |
申请公布号 |
WO2014028488(A1) |
申请公布日期 |
2014.02.20 |
申请号 |
WO2013US54727 |
申请日期 |
2013.08.13 |
申请人 |
FEI COMPANY |
发明人 |
OWEN, MICHAEL JAMES;SULLIVAN, MATT |
分类号 |
H01J37/28;H01J37/244;H01J37/256 |
主分类号 |
H01J37/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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