发明名称 METHOD OF PERFORMING EDX IN A CHARGED–PARTICLE MICROSCOPE
摘要 <p>In order to overcome disadvantages in EDX (Energy Dispersive X-ray) methodologies, a method and a charged particle microscope for performing the method involve using the results of a relatively fast pre-scan to pre-set an optimal value of a chosen input beam parameter, such as beam current, before beginning the acquisition of a matrix of x-ray spectra for a sample.</p>
申请公布号 WO2014028488(A1) 申请公布日期 2014.02.20
申请号 WO2013US54727 申请日期 2013.08.13
申请人 FEI COMPANY 发明人 OWEN, MICHAEL JAMES;SULLIVAN, MATT
分类号 H01J37/28;H01J37/244;H01J37/256 主分类号 H01J37/28
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