发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To improve the performance of a MOS transistor, in a semiconductor device and its manufacturing method.SOLUTION: A method of manufacturing a semiconductor device comprises the steps of: ion-injecting a first impurity into a first region Ion a semiconductor substrate 1; forming a semiconductor layer 28 on the semiconductor substrate 1; forming an element isolation insulating film 34 in grooves formed in the semiconductor layer 28 and the semiconductor substrate 1; ion-injecting a second impurity into a second region IIof the semiconductor layer 28; forming a first gate insulating film 40 and a first gate electrode 42a in the first region I; forming a second gate insulating film 36 and a second gate electrode 42b in the second region II; forming a first source region 62 and a first drain region 64 at both sides of the first gate electrode 42a; and forming a second source region 70 and a second drain region 72 at both sides of the second gate electrode 42b. |
申请公布号 |
JP2014033072(A) |
申请公布日期 |
2014.02.20 |
申请号 |
JP20120172696 |
申请日期 |
2012.08.03 |
申请人 |
FUJITSU SEMICONDUCTOR LTD |
发明人 |
FUJITA KAZUJI;EMA TAIJI;HORI MITSUAKI;TORII YASUNOBU |
分类号 |
H01L21/8238;H01L21/8234;H01L27/088;H01L27/092 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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