ON-CHIP DETECTION OF TYPES OF OPERATIONS TESTED BY AN LBIST

摘要

An integrated circuit includes an LBIST controller operative to run a test program on at least one selection of core logic of the integrated circuit to test the operability of the at least one selection of core logic. The integrated circuit also includes a monitoring logic structure operative to detect at least one type of operation executed for the test program from at least one particular control signal activated by the LBIST controller for controlling the at least one selection of core logic to execute the test program from among at least one control signal for controlling operations on the at least one selection of core logic.