发明名称 |
SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING THE SAME, AND SUBSTRATE FOR SEMICONDUCTOR DEVICE FORMATION |
摘要 |
PROBLEM TO BE SOLVED: To provide an easily manufacturable semiconductor device having high breakdown voltage at a termination part, a method for manufacturing the same, and a substrate for semiconductor device formation.SOLUTION: A method for manufacturing a semiconductor device according to an embodiment comprises the steps of: anodically bonding a glass plate to a silicon wafer; forming a plurality of openings in the glass plate; epitaxially growing a silicon layer on the silicon wafer inside the openings; forming an element on the silicon layer; and dicing a substrate into individual pieces per silicon layer by cutting the silicon wafer and the glass plate along a dicing line which does not pass the silicon layer. |
申请公布号 |
JP2014033070(A) |
申请公布日期 |
2014.02.20 |
申请号 |
JP20120172654 |
申请日期 |
2012.08.03 |
申请人 |
TOSHIBA CORP |
发明人 |
KOMATSU TADASHI;FUSE KAORI;MISAWA HIROTO |
分类号 |
H01L21/20;H01L21/336;H01L29/78 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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