发明名称 SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING THE SAME, AND SUBSTRATE FOR SEMICONDUCTOR DEVICE FORMATION
摘要 PROBLEM TO BE SOLVED: To provide an easily manufacturable semiconductor device having high breakdown voltage at a termination part, a method for manufacturing the same, and a substrate for semiconductor device formation.SOLUTION: A method for manufacturing a semiconductor device according to an embodiment comprises the steps of: anodically bonding a glass plate to a silicon wafer; forming a plurality of openings in the glass plate; epitaxially growing a silicon layer on the silicon wafer inside the openings; forming an element on the silicon layer; and dicing a substrate into individual pieces per silicon layer by cutting the silicon wafer and the glass plate along a dicing line which does not pass the silicon layer.
申请公布号 JP2014033070(A) 申请公布日期 2014.02.20
申请号 JP20120172654 申请日期 2012.08.03
申请人 TOSHIBA CORP 发明人 KOMATSU TADASHI;FUSE KAORI;MISAWA HIROTO
分类号 H01L21/20;H01L21/336;H01L29/78 主分类号 H01L21/20
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