| 摘要 |
<p>The invention relates to means for the examination of a sample, wherein a first input light beam (L1) is totally internally reflected at a detection surface of a sample chamber (111), while a second input light beam (L1') is transmitted through the sample chamber (111). The resulting first and second output light beams (L2, L2') are detected and can be evaluated with respect to frustrated total internal reflection and optical absorbance, respectively. Preferably, both output light beams (L2, L2') are detected by a single image sensor (155).</p> |
