发明名称 Single-mask spacer technique for semiconductor device features
摘要 A method for fabricating vertical surround gate structures in semiconductor device arrays. The method includes forming pillars separated by vertical and horizontal trenches on a substrate. Forming a gate layer over the pillars and trenches such that the gate layer forms gate trenches in the horizontal trenches. The method includes forming fillers within the gate trenches, and planarizing the gate layer and fillers. The method also includes successively etching a first portion of the gate layer, removing the fillers, and etching a second portion of the gate layer.
申请公布号 US8652901(B1) 申请公布日期 2014.02.18
申请号 US201313783388 申请日期 2013.03.03
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LAM CHUNG H.;LI JING
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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