发明名称 Semiconductor devices having fin structures, and methods of forming semiconductor devices having fin structures
摘要 A semiconductor device including at least two fin structures on a substrate surface and a functional gate structure present on the at least two fin structures. The functional gate structure includes at least one gate dielectric that is in direct contact with at least the sidewalls of the two fin structures, and at least one gate conductor on the at least one gate dielectric. The sidewall of the gate structure is substantially perpendicular to the upper surface of the substrate surface, wherein the plane defined by the sidewall of the gate structure and a plane defined by an upper surface of the substrate surface intersect at an angle of 90�+/-5�. An epitaxial semiconductor material is in direct contact with the at least two fin structures.
申请公布号 US8652932(B2) 申请公布日期 2014.02.18
申请号 US201213448749 申请日期 2012.04.17
申请人 ADAM THOMAS N.;CHENG KANGGUO;KHAKIFIROOZ ALI;REZNICEK ALEXANDER;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ADAM THOMAS N.;CHENG KANGGUO;KHAKIFIROOZ ALI;REZNICEK ALEXANDER
分类号 H01L21/76 主分类号 H01L21/76
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