发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>The present invention relates to a semiconductor memory device and a manufacturing method thereof. The semiconductor memory device includes sub patterns formed on a semiconductor substrate, gate line patterns arranged in parallel on the semiconductor substrate between the sub patterns, and an air gap formed in a space between the sub patterns and the gate line patterns, and in a space between the gate line patterns.</p>
申请公布号 KR20140020149(A) 申请公布日期 2014.02.18
申请号 KR20120086886 申请日期 2012.08.08
申请人 SK HYNIX INC. 发明人 KIM, TAE KYUNG;KWON, HYUN YUL
分类号 H01L27/115;H01L21/31;H01L21/8247 主分类号 H01L27/115
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