发明名称 Nonvolatile memory device with a clamping voltage generation circuit for compensating the variations in memory cell parameters
摘要 A nonvolatile memory device comprises a nonvolatile cell array comprising a memory cell and a reference cell, a clamping circuit electrically connected to the memory cell and configured to clamp a voltage applied to a data sensing line during a read operation, and a clamping voltage generation unit configured to generate a clamping voltage responsive to a first voltage having a level based on the reference cell, and to feed back the clamping voltage to the clamping circuit.
申请公布号 US8654595(B2) 申请公布日期 2014.02.18
申请号 US201213604688 申请日期 2012.09.06
申请人 KIM CHAN-KYUNG;HWANG HONG-SUN;PARK CHUL-WOO;KANG SANG-BEOM;OH HYUNG-ROK;SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM CHAN-KYUNG;HWANG HONG-SUN;PARK CHUL-WOO;KANG SANG-BEOM;OH HYUNG-ROK
分类号 G11C7/02 主分类号 G11C7/02
代理机构 代理人
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