| 摘要 |
The present disclosure provides for a system for testing an analog-to-digital converter. The system includes a test pulse source configured to provide a test pulse signal; a test circuit coupled to the test pulse source and configured to provide an analog decaying voltage signal in response to the test pulse signal; and an analog-to-digital converter coupled to the test circuit and configured to convert the analog decaying voltage signal into a digital decaying voltage signal. |
