发明名称 Micromechanical tunable Fabry-Perot interferometer arrangement and a method for producing the same
摘要 The invention relates to controllable Fabry-Perot interferometers which are produced with micromechanical (MEMS) technology. The prior art interferometers have a temperature drift which causes inaccuracy and requirement for complicated packaging. According to the invention the interferometer arrangement has both an electrically tuneable interferometer and a reference interferometer on the same substrate. The temperature drift is measured with the reference interferometer and this information is used for compensating the measurement with the tuneable interferometer. The measurement accuracy and stability can thus be improved and requirements for packaging are lighter.
申请公布号 US8654347(B2) 申请公布日期 2014.02.18
申请号 US201313911319 申请日期 2013.06.06
申请人 TEKNOLOGIAN TUTKIMUSKESKUS VTT 发明人 ANTILA JARKKO;BLOMBERG MARTTI
分类号 G01B9/02;G02B27/00 主分类号 G01B9/02
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