Voltage margin testing device and method

摘要

A voltage margin testing device for testing voltage margin of a unit under test including a voltage terminal includes a button module that selectively allows adjustment of a constant voltage value of a voltage of the voltage terminal, a microcontroller and a digital potentiometer. Selection of the button module causes the microcontroller to adjust a resistance of the digital potentiometer causing the voltage of the voltage terminal to change in increments of the constant voltage value according to the resistance of the digital potentiometer. When the voltage of the voltage terminal is not within the voltage margin, the unit under test works abnormally and sends an error signal to the microcontroller. The microcontroller receives the error signal and adjusts the resistance of the digital potentiometer to change the voltage of the voltage terminal in increments of the constant voltage value until the unit under test works normally.