发明名称 Multi-layer structures and process for fabricating semiconductor devices
摘要 The present invention relates to a method for providing a Silicon-On-Insulator (SOI) stack that includes a substrate layer, a first oxide layer on the substrate layer and a silicon layer on the first oxide layer (BOX layer). The method includes providing at least one first region of the SOI stack wherein the silicon layer is thinned by thermally oxidizing a part of the silicon layer and providing at least one second region of the SOI stack wherein the first oxide layer (BOX layer) is thinned by annealing.
申请公布号 US8652887(B2) 申请公布日期 2014.02.18
申请号 US201213416813 申请日期 2012.03.09
申请人 NGUYEN BICH-YEN;MAZURE CARLOS;FERRANT RICHARD;SOITEC 发明人 NGUYEN BICH-YEN;MAZURE CARLOS;FERRANT RICHARD
分类号 H01L21/00;H01L21/84 主分类号 H01L21/00
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