发明名称 |
Method, phase grating and device for analyzing a wave surface of a light beam |
摘要 |
The application relates to a method for analyzing the wave surface of a light beam from a source to the focus of a lens. The beam illuminates a sample on the analysis plane and having a defect. A diffraction grating of the plane is a conjugate of an analysis plane through a focal system. An image is formed in a plane at a distance from the grating plane and analyzed by processing means. The invention encodes this grating by a phase function resulting from the multiplication of two phase functions, a first exclusion function defining a meshing of useful zones transmitting the beam to be analyzed in the form of light pencil beams, and a second phase fundamental function which creates a phase opposition between two light pencil beams coming out of adjacent meshes of the exclusion grating. |
申请公布号 |
US8654348(B2) |
申请公布日期 |
2014.02.18 |
申请号 |
US20090426994 |
申请日期 |
2009.04.21 |
申请人 |
PRIMOT JEROME;TOULON BRUNO;GUERINEAU NICOLAS;VELGHE SABRINA;HAIDAR RIAD;OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES (ONERA) |
发明人 |
PRIMOT JEROME;TOULON BRUNO;GUERINEAU NICOLAS;VELGHE SABRINA;HAIDAR RIAD |
分类号 |
G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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