发明名称 Enhanced E-field sensing using negative capacitance FET subthreshold slope enhancement
摘要 In certain embodiments, a field effect transistor (FET) can include a substrate, a source electrode, a drain electrode, a ferroelectric material layer, a first gate electrode, and a second gate electrode to maintain an optimal polarization state of the ferroelectric material layer. In other embodiments, a FET can include a film, first and second gates on the film, a ferroelectric material layer covering the film and gates, an insulating layer substantially covering the ferroelectric material layer, a source and a drain on the insulating layer, and a pentacene layer.
申请公布号 US8653510(B2) 申请公布日期 2014.02.18
申请号 US20100972295 申请日期 2010.12.17
申请人 HODGES, JR. JOHN;RIPPEN MARC;BIVER, JR. CARL;SRI INTERNATIONAL 发明人 HODGES, JR. JOHN;RIPPEN MARC;BIVER, JR. CARL
分类号 H01L29/08 主分类号 H01L29/08
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