| 摘要 |
PURPOSE: A chamber system of a test handler and a carrier board circulating method in a test handler are provided to prevent interference between a carrier board circulating in a test handler and other devices. CONSTITUTION: A soak chamber(110) and a desoak chamber(130) changes temperatures of electronic parts loaded on a carrier board into a required temperature or almost room temperature. A supply chamber(140) is horizontally placed in rear parts of the soak chamber and the desoak chamber. A test chamber(120) is placed in a rear part of the supply chamber and electrically connects electronic parts loaded on the carrier board supplied from the supply chamber to a tester. |
