发明名称 |
FINFET AND METHOD FOR MANUFACTURE THEREOF |
摘要 |
A Fin-type transistor (FInFET) and manufacturing method thereof. The FinFET (104) comprises: a semiconductor substrate (101); a stress effect layer (102) on the semiconductor substrate; a semiconductor fin (103') on the stress effect layer and the semiconductor fin comprises two side walls extending along the length direction of semiconductor fin; a gate dielectric layer (106) on the side wall of semiconductor fin; a gate conductor layer (109) on the gate dielectric layer; a source area and a drain area in two bottoms of the semiconductor fin, wherein the stress effect layer under semiconductor fin is parallel to extending along with the semiconductor fin, to make stress effect layer put stress on semiconductor fin, along length direction of semiconductor fin. |
申请公布号 |
WO2014023047(A1) |
申请公布日期 |
2014.02.13 |
申请号 |
WO2012CN80547 |
申请日期 |
2012.08.24 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHU, HUILONG;XU, MIAO |
发明人 |
ZHU, HUILONG;XU, MIAO |
分类号 |
H01L21/336;H01L29/06;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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