发明名称 FINFET AND METHOD FOR MANUFACTURE THEREOF
摘要 A Fin-type transistor (FInFET) and manufacturing method thereof. The FinFET (104) comprises: a semiconductor substrate (101); a stress effect layer (102) on the semiconductor substrate; a semiconductor fin (103') on the stress effect layer and the semiconductor fin comprises two side walls extending along the length direction of semiconductor fin; a gate dielectric layer (106) on the side wall of semiconductor fin; a gate conductor layer (109) on the gate dielectric layer; a source area and a drain area in two bottoms of the semiconductor fin, wherein the stress effect layer under semiconductor fin is parallel to extending along with the semiconductor fin, to make stress effect layer put stress on semiconductor fin, along length direction of semiconductor fin.
申请公布号 WO2014023047(A1) 申请公布日期 2014.02.13
申请号 WO2012CN80547 申请日期 2012.08.24
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHU, HUILONG;XU, MIAO 发明人 ZHU, HUILONG;XU, MIAO
分类号 H01L21/336;H01L29/06;H01L29/78 主分类号 H01L21/336
代理机构 代理人
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