发明名称 |
METHOD FOR FORMING CU WIRING |
摘要 |
A Cu wiring forming method forms Cu wiring in a recess of a predetermined pattern including a trench formed in an insulating film on a substrate surface. The method includes: forming a barrier film at least on a surface of the recess; forming a Cu film by PVD to fill the recess with the Cu film; forming an additional layer on the Cu film; polishing an entire surface by CMP to form the Cu wiring in the recess; forming a metal cap including a manganese oxide film on an entire surface including the insulating film and the Cu wiring of the substrate after performing the CMP polishing; and forming a dielectric cap on the metal cap. |
申请公布号 |
US2014045329(A1) |
申请公布日期 |
2014.02.13 |
申请号 |
US201313962327 |
申请日期 |
2013.08.08 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
ISHIZAKA TADAHIRO;GOMI ATSUSHI;SUZUKI KENJI;HATANO TATSUO;TOSHIMA HIROYUKI;MIZUSAWA YASUSHI |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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