发明名称 METHOD FOR FORMING CU WIRING
摘要 A Cu wiring forming method forms Cu wiring in a recess of a predetermined pattern including a trench formed in an insulating film on a substrate surface. The method includes: forming a barrier film at least on a surface of the recess; forming a Cu film by PVD to fill the recess with the Cu film; forming an additional layer on the Cu film; polishing an entire surface by CMP to form the Cu wiring in the recess; forming a metal cap including a manganese oxide film on an entire surface including the insulating film and the Cu wiring of the substrate after performing the CMP polishing; and forming a dielectric cap on the metal cap.
申请公布号 US2014045329(A1) 申请公布日期 2014.02.13
申请号 US201313962327 申请日期 2013.08.08
申请人 TOKYO ELECTRON LIMITED 发明人 ISHIZAKA TADAHIRO;GOMI ATSUSHI;SUZUKI KENJI;HATANO TATSUO;TOSHIMA HIROYUKI;MIZUSAWA YASUSHI
分类号 H01L21/02 主分类号 H01L21/02
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