发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND OBJECT DISTANCE MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To solve the problem that an error sometimes occurs in a result of distance measurement when diffusion light is irradiated to an object according to the shape and position of the object in object distance measurement by an optical cutting method using pseudo slit light.SOLUTION: An object distance measuring instrument has a correction object determination unit 21 for determining whether there is an area in which diffusion light is irradiated to a rod-shaped object on an imaging surface in imaging data obtained by imaging an object 2 irradiated with the diffusion light from a light source 11 by a camera 12, a survey point calculation unit 22 for estimating a light source center position of the diffusion light on the basis of information on luminance distribution of the diffusion light in the imaging data, and making the light source center position a first survey point, and a distance calculation unit 23 for calculating a distance between the object 2 in the first survey point and the camera 12 by triangulation on the basis of a horizontal distance between a center of the imaging surface in the imaging data and the first survey point, the positions of the camera 12 and the light source 11, and an imaging direction angle of the camera 12.
申请公布号 JP2014029268(A) 申请公布日期 2014.02.13
申请号 JP20120169102 申请日期 2012.07.31
申请人 FUTURE UNIV-HAKODATE;RENESAS ELECTRONICS CORP 发明人 NAGASAKI TAKESHI;TODA SHINJI;OTSUKA SATOSHI
分类号 G01B11/00 主分类号 G01B11/00
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