发明名称 |
METHODS FOR REDUCING THE METAL CONTENT IN THE DEVICE LAYER OF SOI STRUCTURES AND SOI STRUCTURES PRODUCED BY SUCH METHODS |
摘要 |
Methods for producing silicon on insulator structures with a reduced metal content in the device layer thereof are disclosed. Silicon on insulator structures with a reduced metal content are also disclosed. |
申请公布号 |
KR20140018872(A) |
申请公布日期 |
2014.02.13 |
申请号 |
KR20137020296 |
申请日期 |
2012.01.27 |
申请人 |
MEMC ELECTRONIC MATERIALS, INC. |
发明人 |
GRABBE ALEXIS;FLANNERY LAWRENCE P. |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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