发明名称 METHODS FOR REDUCING THE METAL CONTENT IN THE DEVICE LAYER OF SOI STRUCTURES AND SOI STRUCTURES PRODUCED BY SUCH METHODS
摘要 Methods for producing silicon on insulator structures with a reduced metal content in the device layer thereof are disclosed. Silicon on insulator structures with a reduced metal content are also disclosed.
申请公布号 KR20140018872(A) 申请公布日期 2014.02.13
申请号 KR20137020296 申请日期 2012.01.27
申请人 MEMC ELECTRONIC MATERIALS, INC. 发明人 GRABBE ALEXIS;FLANNERY LAWRENCE P.
分类号 H01L21/20 主分类号 H01L21/20
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