| 摘要 |
<p>The invention relates to a method of measuring parameters S of a device under test (6) in pulsed mode with the aid of a vector array analyzer (4) characterized in that the vector array analyzer (4) is configured so as to operate in continuous wave mode CW, and a power signal RF is applied to the device under test only for the useful duration of the measurements, said duration and the recurrence period of said measurements being controlled by the parameterization of the bandwidth of the filter applied at the intermediate frequency of the vector array analyzer (4).</p> |
