DEVICE AND METHOD FOR OPTICAL MEASUREMENT FOR PROJECTION OF PHASE-SHIFT LIGHT PATTERNS

摘要

The invention relates to a device and to a method for optical measurement for projection of phase-shift light patterns onto an image area (4) to be scanned on a surface (10) of an object (1) to be measured. To this end, what are provided are a light source (2) that irradiates a light line (1), a light deflection device (3) to which the light line (1) is directed and which deflects the light line (1) as a deflected light line (Iu) toward the image area (4), and a control device (6). What is advantageous in the process is a drive device (7) for shifting the light deflection device (3) and for guiding the deflected light line (Iu) across the image area (4) to be scanned in a scanning step (sc). The light output is modulated during the scan in order to generate a stripe pattern.