发明名称 |
Inverter circuit comprising density of states engineered field effect transistors |
摘要 |
An essentially planar inverter circuit comprises an n-channel transistor employing a first layer structure and a p-channel transistor employing a second layer structure. The first layer structure comprises a first semiconductor layer having a conduction band minimum E C1 ; a second semiconductor layer having a first discrete hole level H 0 ; a first wide bandgap semiconductor barrier layer disposed between the first and the second semiconductor layers; a first gate dielectric layer (604) disposed above the first semiconductor layer; and a first gate metal layer (602) disposed above the first gate dielectric layer; wherein the first discrete hole level H 0 is positioned below the conduction band minimum E c1 for zero bias applied to the first gate metal layer. The second layer structure comprises a third semiconductor layer having a second discrete hole level H 0 ; a fourth semiconductor layer having a conduction band minimum E C2 ; a second wide bandgap semiconductor barrier layer disposed between the third and the fourth semiconductor layers; a second gate dielectric layer (904) disposed above the third semiconductor layer; and a second gate metal layer (902) disposed above the second gate dielectric layer; wherein the second discrete hole level H 0 is positioned below the conduction band minimum E c2 for zero bias applied to the second gate metal layer. |
申请公布号 |
EP2355154(A3) |
申请公布日期 |
2014.02.12 |
申请号 |
EP20110000711 |
申请日期 |
2011.01.28 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
PASSLACK, MATTHIAS |
分类号 |
H01L27/092;H01L29/778 |
主分类号 |
H01L27/092 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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