发明名称 Validation process for fault detection of a device
摘要 A process for validating the fault detection of a device under test includes carrying out a series of basic tests of the device under test. Each basic test leads to a positive or negative result indicating normal or abnormal functioning of the device under test. The process also includes, after each realization of a basic test, updating an event counter (CRT) and updating a result counter (FCRT). Validation is performed depending on test result once the event counter has reached a first maximal value (CTRmax) or once the realization counter has reached a second maximal value (FCTRmax). The process can be performed by a diagnostic device. The process and device can monitor the electric or functional performance of more or less complex systems installed in an automobile.
申请公布号 US8650003(B2) 申请公布日期 2014.02.11
申请号 US20070373961 申请日期 2007.06.29
申请人 REGNARD DE LAGNY JOSEPH;BELAID ABDELMALIK;RENAULT S.A.S. 发明人 REGNARD DE LAGNY JOSEPH;BELAID ABDELMALIK
分类号 G01M99/00;G06F15/00 主分类号 G01M99/00
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