发明名称 Modular scanner apparatus and probe holding apparatus for inspection
摘要 There is provided a modular scanner and probe holding apparatus for inspection, which consists of an assembly of a plurality of connective links rigidly connected. The connective links are added or removed from the assembly to size the assembly so the assembly extends more than half way around a circumference of a tubular body to be inspected. At least one tail link is connected to an end of the assembly. The tail link is biased by a spring to apply a force against the tubular body to hold the assembly in place. A probe holder link is provided that connects to the connective links and has a probe holder for holding a probe.
申请公布号 US8646347(B2) 申请公布日期 2014.02.11
申请号 US20100824330 申请日期 2010.06.28
申请人 DUBBELDAM ARTHUR J.;DUBBELDAM MARK P.;TORSTENSEN PAUL E.;WIEBE JASON P.;JIREH INDUSTRIES LTD. 发明人 DUBBELDAM ARTHUR J.;DUBBELDAM MARK P.;TORSTENSEN PAUL E.;WIEBE JASON P.
分类号 G01D21/00;G01M99/00 主分类号 G01D21/00
代理机构 代理人
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