发明名称 SYSTEM AND METHOD FOR DETECTING AND REPAIRING DEFECTS IN AN ELECTROCHROMIC DEVICE USING THERMAL IMAGING
摘要 <p>System (1) and method (100) for detecting and repairing a defect in an electrochromic device (30) may include acquiring a thermal image of the electrochromic device (30) when the device is in an operating state. In addition, the system and method may include processing thermal imaging data representative of the thermal image to detect a defect in the electrochromic device by comparing a thermal amplitude detected at one or more pixels of the thermal image with a predetermined value, and to determine a location of the electrochromic device corresponding to the detected defect.</p>
申请公布号 KR20140017595(A) 申请公布日期 2014.02.11
申请号 KR20137026660 申请日期 2012.03.29
申请人 SAGE ELECTROCHROMICS, INC. 发明人 PALM STEVE;GIRON JEAN CHRISTOPHE;LETOCART PHILIPPE;ROUSSELET JEROME;SELLES OLIVIER;WERNER KATJA
分类号 G06T7/00;G01N25/72 主分类号 G06T7/00
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