| 摘要 |
The invention concerns a process and apparatus for monitoring the level of surface irregularity in a moving threadline, comprising: (a) illuminating the threadline via a light source positioned incident to the thread line at an entrance angle of greater than 0 degrees and less than 90 degrees to the threadline to produce spectral reflectance energy and diffuse reflectance energy; (b) measuring the amount of spectral reflectance energy from the threadline with a first receiver positioned incident to the threadline at an exit angle that is substantially equal to the entrance angle; (c) measuring the amount of diffuse reflectance energy from the threadline with a second receiver positioned at an angle that is different than the entrance angle and the exit angle, (d) determining the ratio of the amount of diffuse reflectance energy to the amount of spectral reflectance energy; and (e) relating said ratio to the level of surface irregularity. |
