发明名称 APPARATUS AND METHOD FOR CALCULATING A WAFER POSITION IN A PROCESSING CHAMBER UNDER PROCESS CONDITIONS
摘要 <p>An apparatus for processing a wafer includes a reaction chamber having a reaction space for processing a wafer, a susceptor positioned in the reaction chamber and having a sidewall, at least one light source positioned in the outside of the reaction space, and at least one window in the reaction chamber. The at least one light source is orientated to pass through the window and touch the sidewall.</p>
申请公布号 KR20140016838(A) 申请公布日期 2014.02.10
申请号 KR20130089998 申请日期 2013.07.30
申请人 ASM IP HOLDING B.V. 发明人 MARQUARDT DAVID;SHUGRUE JOHN
分类号 H01L21/66;H01L21/02 主分类号 H01L21/66
代理机构 代理人
主权项
地址