| 摘要 |
FIELD: measurement equipment.SUBSTANCE: use: for performing X-ray analysis of the sample. The invention consists in the fact that irradiation is performed with X-rays from a sample source of polychromatic X-ray radiation, a combined device is used for recording of XRD and XRF, comprising a scanning wavelength selector and at least one X-ray detector dedicated for registration of X-rays selected by the wavelength selector, and performing XRD-analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample, using a scanning wavelength selector and recording the selected X-ray fixed wavelength (wavelengths) on one or more values of the angle of diffraction ? of the sample using the detector (s) of X-ray radiation, and/or performing XRF-analysis of a sample by scanning the wavelengths of X-rays emitted from the sample, using a scanning wavelength selector and registration of the scanned x-ray wavelengths, using the detector (s) of X-radiation.EFFECT: higher sensitivity in X-ray analysis of the sample.24 cl, 16 dwg |
