发明名称 |
WORKPIECE CONVEYING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To prevent a wafer holding mechanism of a conveying mechanism from being brought into contact with a semiconductor wafer even if a joint position on a glass substrate of the semiconductor wafer is deviated from an ideal position.SOLUTION: A workpiece conveying device for conveying a workpiece includes a substrate layer and a layer to be processed on a part of the substrate layer. The workpiece conveying device includes a workpiece holding mechanism configured to operate so as to hold and release the workpiece. The workpiece holding mechanism has at least one workpiece holding surface having a taper to hold the substrate layer of the workpiece in a state in which the layer to be processed is located under the substrate layer. The workpiece holding surface having the taper is configured in such a manner that a prescribed distance R or a clearance whose size is equal to R or more exists between the workpiece holding surface and the layer to be processed of the workpiece when the workpiece is held by the workpiece holding mechanism. |
申请公布号 |
JP2014024161(A) |
申请公布日期 |
2014.02.06 |
申请号 |
JP20120166701 |
申请日期 |
2012.07.27 |
申请人 |
EBARA CORP |
发明人 |
KOSUGE RYUICHI;NISHIDA HIROAKI;SONE CHUICHI;AIZAWA HIDEO;TANAKA TOMOHIRO |
分类号 |
B25J15/08;B65G49/07;H01L21/677 |
主分类号 |
B25J15/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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