发明名称 WORKPIECE CONVEYING DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent a wafer holding mechanism of a conveying mechanism from being brought into contact with a semiconductor wafer even if a joint position on a glass substrate of the semiconductor wafer is deviated from an ideal position.SOLUTION: A workpiece conveying device for conveying a workpiece includes a substrate layer and a layer to be processed on a part of the substrate layer. The workpiece conveying device includes a workpiece holding mechanism configured to operate so as to hold and release the workpiece. The workpiece holding mechanism has at least one workpiece holding surface having a taper to hold the substrate layer of the workpiece in a state in which the layer to be processed is located under the substrate layer. The workpiece holding surface having the taper is configured in such a manner that a prescribed distance R or a clearance whose size is equal to R or more exists between the workpiece holding surface and the layer to be processed of the workpiece when the workpiece is held by the workpiece holding mechanism.
申请公布号 JP2014024161(A) 申请公布日期 2014.02.06
申请号 JP20120166701 申请日期 2012.07.27
申请人 EBARA CORP 发明人 KOSUGE RYUICHI;NISHIDA HIROAKI;SONE CHUICHI;AIZAWA HIDEO;TANAKA TOMOHIRO
分类号 B25J15/08;B65G49/07;H01L21/677 主分类号 B25J15/08
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