发明名称 Acoustic Assisted Single Wafer Wet Clean For Semiconductor Wafer Process
摘要 An apparatus for cleaning a substrate includes a dispense head configured to supply a liquid medium as a meniscus to the surface of the substrate and a rinse head that is equipped with at least an inlet conduit to supply rinse chemical to a top substrate surface as a meniscus. An outlet conduit is disposed on either side of the inlet conduit and is configured to remove the rinse chemical and liquid medium from the substrate surface. The inlet conduit and the outlet conduits are perpendicular to the surface of the rinse head that faces the substrate and parallel to one another. A first and second transducers are disposed in a portion of the rinse head between the inlet conduit and each of the outlet conduits. The transducers are configured to transmit acoustic energy to the meniscus when formed between the surface of the rinse head and the substrate.
申请公布号 US2014034096(A1) 申请公布日期 2014.02.06
申请号 US201314050307 申请日期 2013.10.09
申请人 LAM RESEARCH CORPORATION 发明人 PENG GRANT;MUI DAVID;KON SHIH-CHUNG
分类号 H01L21/67 主分类号 H01L21/67
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