发明名称 DEVICE, METHOD, AND PROGRAM FOR PREDICTING FAR ELECTRIC FIELD INTENSITY
摘要 PROBLEM TO BE SOLVED: To analyze causes of a radiation noise, in more detail to make it easier to take appropriate measures for reducing the radiation noise.SOLUTION: A far electric field intensity prediction device 20 is provided, which computes far electric field intensity generated by an object under analysis configured such that a driver unit sends a signal to a receiver unit through a node. The far electric field intensity prediction device includes: a circuit simulator 28; and a far electric field computation module 29. The circuit simulator 28 computes transmission line charge/discharge current, driver unit charge current, driver unit through-current, receiver unit charge current, and receiver unit through-current, and the far electric field intensity computation means computes far electric field intensity caused by each of the transmission line charge/discharge current, driver unit charge current, driver unit through-current, receiver unit charge current, and receiver unit through-current.
申请公布号 JP2014026599(A) 申请公布日期 2014.02.06
申请号 JP20120168659 申请日期 2012.07.30
申请人 RENESAS ELECTRONICS CORP 发明人 KAMIMURA ATSUSHI;SASAKI HIDEKI;IRINO HITOSHI
分类号 G06F17/50 主分类号 G06F17/50
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