发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To improve charge holding characteristics.SOLUTION: A nonvolatile semiconductor memory device comprises: a memory cell array 5 including a plurality of memory cell transistors MTr each storing information depending on a threshold level of n value (n is an integer of greater than 2); and a control circuit 10 controlling the memory cell array. In write operation, the control circuit shifts the threshold level of the plurality of memory cell transistors to a base threshold level that is a threshold level other than a threshold level of the highest voltage and a threshold level of the lowest voltage among the threshold level of n value, and then shifts the threshold level of the plurality of memory cell transistors to any one of the threshold levels of n value. |
申请公布号 |
JP2014026695(A) |
申请公布日期 |
2014.02.06 |
申请号 |
JP20120165637 |
申请日期 |
2012.07.26 |
申请人 |
TOSHIBA CORP |
发明人 |
YASUDA NAOKI;KITO TAKASHI |
分类号 |
G11C16/02;H01L21/336;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
G11C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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