发明名称 BUILT-IN SELF TEST CIRCUIT AND METHOD, SEMICONDUCTOR DEVICE, AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To shorten the test time of an output voltage switching test of a voltage regulator.SOLUTION: A register 3 outputs a digital output voltage switching signal Dp to a D/A conversion circuit 9 of a voltage regulator 8. A stabilization wait circuit 4 inputs the output voltage switching signal Dp as a digital voltage signal S10 via the D/A conversion circuit 9 and A/D conversion circuit 10; determines whether or not the digital voltage signal S10 is stabilized within a maximum stabilization wait time; outputs, if the digital voltage signal S10 is stabilized within the maximum stabilization wait time, a digital voltage signal Da at the stabilization timing; and outputs, if the digital voltage signal S10 is not stabilized within the maximum stabilization wait time, the digital voltage signal Da when the maximum stabilization wait time has elapsed. When the digital voltage output signal Da does not match the output voltage switching signal Dp, a test control circuit 6 outputs a test result signal S6 indicating the voltage regulator 8 does not operate correctly.
申请公布号 JP2014027142(A) 申请公布日期 2014.02.06
申请号 JP20120166918 申请日期 2012.07.27
申请人 RICOH CO LTD 发明人 KAMIZAWA YUSUKE;KANEKO TAKAHISA
分类号 H01L21/822;G01R31/28;G01R31/316;H01L27/04 主分类号 H01L21/822
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