发明名称 METHOD AND STRUCTURE OF FORMING BACKSIDE THROUGH SILICON VIA CONNECTIONS
摘要 A method, and the resulting structure, to make a thinned substrate with backside redistribution wiring connected to through silicon vias of varying height. The method includes thinning a backside of a substrate to expose through silicon vias. Then a thick insulator stack, including an etch stop layer, is deposited and planarized. With a planar insulating surface in place, openings in the insulator stack can be formed by etching. The etch stop layer in the dielectric stack accommodates the differing heights vias. The etch stop is removed and a conductor having a liner is formed in the opening. The method gives a unique structure in which a liner around the bottom of the through silicon via remains in tact. Thus, the liner of the via and a liner of the conductor meet to form a double liner at the via/conductor junction.
申请公布号 US2014035109(A1) 申请公布日期 2014.02.06
申请号 US201213562927 申请日期 2012.07.31
申请人 VOLANT RICHARD P.;FAROOQ MUKTA G.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 VOLANT RICHARD P.;FAROOQ MUKTA G.
分类号 H01L23/48;H01L21/28 主分类号 H01L23/48
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