发明名称 |
COMPOUND SEMICONDUCTOR STRUCTURE |
摘要 |
A semiconductor structure (1) comprises a dielectric layer (2) including a dielectric material having a dielectric constant higher than that of silicon oxide; a channel region (3) including a compound semiconductor material; a passivation layer (4) including a passivation material between the channel region (3) and the dielectric layer (2); and a barrier layer (5) including a barrier material between the dielectric layer (2) and the passivation layer (4) for reducing a chemical reaction of the dielectric material of the dielectric layer (2) with the passivation material of the passivation layer (4). |
申请公布号 |
US2014035001(A1) |
申请公布日期 |
2014.02.06 |
申请号 |
US201213565106 |
申请日期 |
2012.08.02 |
申请人 |
CZORNOMAZ LUKAS;EL KAZZI MARIO;FOMPEYRINE JEAN;MARCHIORI CHIARA;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
CZORNOMAZ LUKAS;EL KAZZI MARIO;FOMPEYRINE JEAN;MARCHIORI CHIARA |
分类号 |
H01L29/78;H01L21/20 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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