发明名称 COMPOUND SEMICONDUCTOR STRUCTURE
摘要 A semiconductor structure (1) comprises a dielectric layer (2) including a dielectric material having a dielectric constant higher than that of silicon oxide; a channel region (3) including a compound semiconductor material; a passivation layer (4) including a passivation material between the channel region (3) and the dielectric layer (2); and a barrier layer (5) including a barrier material between the dielectric layer (2) and the passivation layer (4) for reducing a chemical reaction of the dielectric material of the dielectric layer (2) with the passivation material of the passivation layer (4).
申请公布号 US2014035001(A1) 申请公布日期 2014.02.06
申请号 US201213565106 申请日期 2012.08.02
申请人 CZORNOMAZ LUKAS;EL KAZZI MARIO;FOMPEYRINE JEAN;MARCHIORI CHIARA;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CZORNOMAZ LUKAS;EL KAZZI MARIO;FOMPEYRINE JEAN;MARCHIORI CHIARA
分类号 H01L29/78;H01L21/20 主分类号 H01L29/78
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