发明名称 EMBEDDED SILICON GERMANIUM N-TYPE FILED EFFECT TRANSISTOR FOR REDUCED FLOATING BODY EFFECT
摘要 A method for fabricating a semiconductor device includes forming a gate stack on an active region of a silicon-on-insulator substrate. The active region is within a semiconductor layer and is doped with an p-type dopant. A gate spacer is formed surrounding the gate stack. A first trench is formed in a region reserved for a source region and a second trench is formed in a region reserved for a drain region. The first and second trenches are formed while maintaining exposed the region reserved for the source region and the region reserved for the drain region. Silicon germanium is epitaxially grown within the first trench and the second trench while maintaining exposed the regions reserved for the source and drain regions, respectively.
申请公布号 US2014038368(A1) 申请公布日期 2014.02.06
申请号 US201314049765 申请日期 2013.10.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHANG LELAND;LAUER ISAAC;LIN CHUNG-HSUN;SLEIGHT JEFFREY W.
分类号 H01L21/8238 主分类号 H01L21/8238
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