| 摘要 |
[Problem] The problem to be addressed by the present invention is to provide technology which, using discrepancies generated by differences in various parameters in a manufacturing device or a manufacturing step, manages distribution of manufactured goods in which the component has been mounted. The present invention: performs clustering of a distribution information log database, which associates an image feature of a pattern applied to the surface of a component with product information related to a product to which the component has been mounted and/or distribution information related to distribution of the product, on the basis of the image feature; and performs statistical processing so as to analyze the distribution information and/or the product information that has been associated with the image feature belonging to each group acquired by the clustering. |
